Journal of Geology & Geophysics
Open Access
ISSN: 2381-8719
+44 1478 350008
ISSN: 2381-8719
+44 1478 350008
Mishra PK
CSIR-Institute of Minerals and Materials Technology,
Odisha
India
Research Article
Microstructural, Raman, EPMA and X-ray Tomographic Study of the Odisha's Beryl (Emerald) Sample
Author(s): Jena PR and Mishra PKJena PR and Mishra PK
This study presents Optical, Microstructural, EPMA and X-ray tomography studies of the chromium-containing Beryl samples of Bangiriposi, Mayurbhanj district of Odisha. The detailed microscopic studies followed by EDAX analysis of different phases revealed the presence of beryllium aluminium silicate as the major matrix with yttrium silicate, Apatite, Albite, Quartz, Zircon, Cordierite and Ferichromite as minor inclusions. Micro-Raman data of the polished surface established the presence of gaseous (CO2, CH4), Water, and other Minerals. Few rare earth (lanthanides) elements such as Ce, Nd, Gd, Y and Sc, along with other transitional elements such as Ti and Zr, Cs are found to be present in these beryl samples. The volume percentage of silicate, phosphate, and oxide, as well as gaseous inclusions, are determined by X-ray tomographic study and are found to be 24%, 3.. View More»
DOI:
10.4172/2381-8719.1000288